Difrotec builds better interferometer than the best in market
better accuracy than fizeau interferometer
High accuracy point diffraction interferometer
High accuracy point diffraction interferometery
Industrial point diffraction interferometery
point diffraction interferometer
point diffraction interferometry
absolute surface form
optical metrology
Interferometer
transimtted wavefronts quality testing
high phase contrast fringe patterns
modern interferometry techniques
testing microscope optics
testing adaptive optics
testing ultraviolet optics
testing tescopes optics
testing space optics
testing wavefronts
imaging wavefronts
nanometer resolution optical surface detection
high precision optical instrument
Automatic fringe analysis

Breakthrough 

technology in optical testing

Interferometer D7
world-record angstrom scale accuracy:

  • absolute accuracy
 λ/900 (0.7 nm)
  • numerical aperture
 0.55 (f# 0.91)
  • repeatability (simple RMS)
 < 0.06 nm


Illustration by Taavi Torim
Find out why Tartu Observatory chose Difrotec to test their space optics 
more...


  • testing spherical, flat, asphere & freeforms
  • testing transmitted wavefront of optical systems
  • curvature radius measurements
  • optical design & fabrication




Why Difrotec ? 

  • Compact, highly accurate & simple to operate products
  • Products can be easily adapted to changing industry needs
  • Results with high signal to noise ratio with no spurious fringes
  • No errors propagating from the physical reference optics  
  • A dedicated development team for unique custom solutions
   more...

Fizeau interferometers mask the real surface form

Our D7 sees the real form with the state-of-the-arts accuracy 



News & Events

 D7 enhances space camera
Difrotec's flagship interferometer, D7 found out that two very high quality "identical" optics to be deployed on satellite's space camera were not identical after all. One resolved three times less details than the other. An important detail before deployment.







Meet us in Munich 
at SPIE Optical Metrology conference
26-28 June 2017